Inel offers a large variety of acquisition programs, for standard as well as for custom hardware configurations. All programs run under Windows®. The list includes the programs for powder and high resolution diffractometers, data acquisition of stress (plane and triaxial), retained austenite and textures (Equal area scan, Hexagonal Scan).
The programs can control scintillating counters, proportional detectors, position sensitive detectors, up to 16 motions, high and Low-Temperature chambers, X-ray generator and other devices. 

SYMPHONIX software features

























Data Collection : real time display of data collection (PSD or scanning mode), data overlay, can be done as background process, batch mode data collection. Printouts and data savings/export available during data collection. Real time 3D display available in case of data overlay and/or batch acquisition. Dead time correction for PSD acquisition...
User friendly Batch experiment editor.

Data Processing : background subtraction, smoothing, kalpha2 stripping, Peak search, Peak fitting (fully automatic, or semi-manual) : several envelopes available, data correction (eccentricity, offset, absorption), data linearization, data conversion (ASCII, GSAS, JADE, …), data overlay, standard overlay, user database overlay, calculated pattern overlay, crystallite size. PSD Calibration tool...

Display : 2D interactive full color display (up to 4 axes, change color, limits, units, labeling…). 3D display in case of batch experiment (dynamic studies, reflectometry, Texture recordings) or data overlay, ODF 2D and 3D plots, graphic output as bitmap or PDF files, data export as XML, XLS, Text files...


© Inel France


Match! Phase Identification from Powder Diffraction
 

     













 


Match! is an easy-to-use software for phase identification from powder diffraction data, which has become a daily task in material scientist’s work. Match! compares the powder diffraction pattern of your sample to a database containing reference patterns in order to identify the phases which are present. Single as well as multiple phases can be identified based on both peak data and raw (profile) data.
As reference database, you can apply the included free-of-charge COD database and/or ICSD/Retrieve (if you have a valid license), use any ICDD PDF product, and/or create a user database based on your own diffraction patterns. The user database patterns can be edited manually, imported from peak files, calculated from crystal structure data (e.g. CIF files), or imported from your colleague's user database.

Copyright © 1997-2011 Crystal Impact GbR


Maud - Materials Analysis Using Diffraction   - Based on the Rietveld method (free software)

MAUD stands for Material Analysis Using Diffraction. It is a general diffraction/reflectivity analysis program mainly based on the Rietveld method, but not limited to.


 
Developed by Dr. Luca Lutterotti


Easy to use, every action is controlled by a GUI

Works with X-ray, synchrotron, Neutron, TOF

Developed for Rietveld analysis, simultaneous multi-spectra and different instruments / techniques supported
.
 
 
 

 

Main features :

Ab-initio structure solution integration, from peak finding, indexing to solving
Different optimization algorithms available (LS, Evolutionary, Simulated Annealing, Metadynamics)
Le Bail fitting
Quantitative phase analysis
Microstructure analysis (size-strain, anisotropy and distributions included)
Texture and residual stress analysis using part or full spectra
MEEM and superflip algorithm for Electron Density Maps and fitting
Thin film and multilayer aware; film thickness and absorption models
Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation
Works with TEM diffraction images and electron scattering
Several data files input formats
Works and input images from 2D detectors (image plates, CCD)
CIF compliance for input/output; import structures from databases

© Luca Lutterotti

Other software

LaboTex,
the Texture Analysis Software

The LaboTex software is the tool for complex and detailed analysis of crystallographic textures. The program performs in user friendly form the different calculations and graphic analysis of Orientation Distribution Function (ODF), Pole Figures (PFs) and Inverse Pole Figures (IPFs).

© LaboSoft s.c.

StressDiff,
a powerful, user-friendly Stress Calculation Software

Developed by Dr. Jean Marie Sprauel, expert in residual stress measurement, this easy to use software has all the latest features.


© Jean Marie Sprauel


      X-RAY DIFFRACTION

   FOR THE 21ST CENTURY

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Inel Inc, PO Box 147,
Stratham, 03885 NH, USA
T 001 603 778 9161 - F 001 603 778 9171