Powder X-Ray Diffractometer

• Real time acquisition

• High resolution detection
• Thin film attachment

Equinox 3000. A research grade very high resolution diffraction system providing the user a choice of features included higher resolution detectors, a larger sample area  and choice of X-ray sources. The free space ine the sample compartment is very large and will accommodate practically any sample and any sample handling device including furnaces, auto samplers, large assemblies, etc. The 2θ diffraction pattern is therefore measured in “real time” allowing time dependant or kinetics experiments to be made with considerable advantage.

Measurements are very fast compared with other diffractometers in that the unique Equinox curved detector can measure all diffraction peaks simultaneously. Crystallographic results are collected in a few seconds therefore analyzing a phase transition or unstable compound becomes possible – all with a low cost system.

• Simple to use

• Very reliable

• Superb resolution
• No alignment

• Extremely accurate

• No routine maintenance



Acquisition in real time over 90° or 120° 2θ
Monochromatic optic
Generator 3500 Watts
Wavelength : Copper, Cobalt, Molybdenum, ...               
Sample holder
Automatic sample changer
Specific camera

Heating camera

High and low temperature
Various atmosphere

Thin film attachment


The HTK1200N Oven-Chamber is designed for non ambient X-ray studies up to 1200°C.

Numerous software applications (*): qualitative analysis, phase identification and quantification, crystallite size determination, crystal structure analysis, Rietveld analysis, phase transition, thin film, …

(*) Applications depend upon on choice of accesssories - ask us to help you configure a system as per your needs.

Multitechnique sample holder (powder, bulk, thin film)

Some sample holders

Spinning sample holder
Reflection / transmission mode
Capillary sample holder Transmission mode Gandolfi camera
Transmission mode
Automatic sample changer
with 30 positions

Download EQUINOX 3000 documentation 

EQUINOX 100 : Stand Alone Benchtop X-Ray diffractometer
EQUINOX 1000 : Benchtop X-Ray diffractometer
EQUINOX 2000 : XRD and thermo-diffraction
EQUINOX 3000 : Powder X-Ray diffractometer
EQUINOX 4000 : X-Ray diffractometer for micro diffraction
EQUINOX 5000 : High resolution X-Ray diffractometer
EQUINOX 6000 : X-Ray diffractometer for texture / stress




T 001 603 778 9161
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Inel Inc, PO Box 147,
Stratham, 03885 NH, USA
T 001 603 778 9161 - F 001 603 778 9171