4-circle X-Ray Diffractometer

• Real time acquisition

• High resolution detection
• Texture and stress applications
 


 
The Equinox 6000 is a multi purpose X-ray diffractometer designed specifically for high level research applications. The system utilizes an unique tall vertical goniometer in θ/θ or θ/2θ mode with an attached high precision Eulerian cradle. It is the perfect diffraction system for materials science including thin layer analysis, reflectometry, micro diffraction, residual stress analysis, texture measurements. Data is measured in “real time”, which present many advantages in kinetics experiments or combined analyses.
 
Measurements are very fast compared with other diffractometers in that the unique Equinox curved detector can measure all diffraction peaks simultaneously. Due to this acquisition in real time, combined studies are facilitated.

          • Perfect for advanced research applications

          • Very reliable, extremely accurate

          • Superb resolution                                   
            
    

Specifications


4-circle goniometer

Acquisition in real time over 90 or 120° 2θ
Monochromatic optic, collimator system
Generator 3500 Watts

Various wavelength
Sample holder (powder, bulk, thin film)

High temperature camera
Software

 

            Last Inel generation 4-circle goniometer

                                                                                                                                                                                                                                                                                                                                                                                                                                                                          4-circle high temperature attachment 

                                                                                                                                        DHS1100, dome hot stage for non ambient X-ray studies

Numerous software applications (*) : texture, stress, thin film, qualitative analysis, phase identification and quantification, degree of crystallinity determination, crystal structure analysis, Rietveld analysis, phase transition, …

(*) Applications depend upon on choice of accesssories - ask us to help you configure a system as per your needs.

Download EQUINOX 6000 documentation

 
EQUINOX 100 : Stand Alone Benchtop X-Ray diffractometer
EQUINOX 1000 : Benchtop X-Ray diffractometer
EQUINOX 2000 : XRD and thermo-diffraction
EQUINOX 3000 : Powder X-Ray diffractometer
EQUINOX 4000 : X-Ray diffractometer for micro diffraction
EQUINOX 5000 : High resolution X-Ray diffractometer
EQUINOX 6000 : X-Ray diffractometer for texture / stress



     

      X-RAY DIFFRACTION

   FOR THE 21ST CENTURY

CALL US
T 001 603 778 9161
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Inel Inc, PO Box 147,
Stratham, 03885 NH, USA
T 001 603 778 9161 - F 001 603 778 9171